In this work, Scanning Probe Microscopy (SPM), in the contact (Atomic Force Microscopy - AFM) and magnetic force (Magnetic Force Microscopy - MFM) modes, has been used to analyze the microstructure of a solution-treated and aged 2205 duplex stainless steel. A surface analysis of the solution-treated steel has been performed by AFM after passive film growth. By AFM it was obtained a indication of film growth on the microstructure of the solution-treated steel, while by MFM the phase distribution could be observed without the need of surface etching.
Duplex stainless steel; film growth; SPM; microstructure
