A strain of Xanthomonas campestris pv. vesicatoria showing resistance to 1.2 mM cupric sulfate was analyzed by atomic absorption spectroscopy and ESI (electron spectrophotometry imaging). Accumulation of copper was detected in the periphery of the cell membrane region, suggesting that the mechanism of copper resistance is similar to that previously described for Pseudomonas species. The ESI technique was used to detect copper in the membrane region. Copper-resistance in X. campestris pv. vesicatoria 484 is inducible and occurs by accumulation of the metal and not by efflux mechanism as has been suggested. The growth curve also showed that this system is inducible.
copper accumulation; Xanthomonas campestris; vesicatoria