This study explores the structural, ferroelectric and dielectric properties of the Tm-doped (Pb0.91La0.09)(Zr0.65Ti0.35)O3 (PLZT) ferroelectric system as a function of the dopant concentration in the ferroelectric matrix. The ceramic bodies were prepared by the conventional solid state synthesis method. The X-ray diffraction pattterns reveal a formation of the desired crystalline phase, perovskite, with pseudo-cubic symmetry plus a small amount of a secondary phase for the dopant concentration > 1.7 mol%, constituted mainly by Tm3+ and Zr4+. The lattice volume, evaluated by the diffraction peaks position, showed at least two dopant incorporation mechanism on the PLZT matrix. From the electrical properties it was possible to verify the effects of the dopant ion Tm3+ occupancy in the PLZT lattice, in agreement with the structural results.
PLZT; limit of solubility; rare-earth dopant and dopant occupancy
