Grain yield is affected by plant lodging, and this is a serious problem mainly for tall wheat cultivars. A field trial was conducted during 1999 growing season to investigate the variability for some morphological traits associated to lodging resistance in 14 wheat genotypes. It was found variability for all traits evaluated. Values of lodging resistance coefficient, plant height, length of peduncle and culm index were highly correlated with lodging resistance. These traits can be recommended for lodging resistance indirect selection. Among genotypes evaluated, line TB 951 showed the best performance for all traits related to lodging resistance. So, that line can be indicated as an excellent lodging resistance source in bread wheat.
Triticum aestivum; plant height; diameter of stem; length of peduncle; indirect selection
