Infrared radiation peeling experiment of yellow peach and optimization of technological parameters

DING, Tianhang; SONG, Weidong; WANG, Jiaoling; WU, Jinji; WANG, Mingyou; ZHOU, Dehuan

doi:10.1590/fst.68321

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Original Article • Food Sci. Technol 42 • 2022 • https://doi.org/10.1590/fst.68321 copy

Infrared radiation peeling experiment of yellow peach and optimization of technological parameters

Authorship SCIMAGO INSTITUTIONS RANKINGS

Abstract

Conventional strong alkali spray peeling method for peeling yellow peach resulted in process hazard and negative environmental impacts. The efficacy of using infrared (IR) heating as an alternative method for peach peel removal was investigated to improve the operation safety and peeling quality. Herein, we introduce the Box-Behnken central combination method for conducting IR radiation tests. A multivariate regression model combining radiation distance, heating time and IR power as variable factors and surface temperature, full peeling time and firmness loss of yellow peach as the objective functions was developed to establish the optimal IR radiation parameters for peeling the skin of yellow peach. We found radiation distance of 76.18mm, heating time of 256.36 s, and IR power was 1000 w were the optimal conditions for this process. These conditions achieved surface temperature of 211.7 °C, firmness loss of 3.8 × 10⁵ Pa, and full peeling time of 149.6 s. Thus, IR radiation is a feasible mechanism for peeling yellow peach, providing a new, safer and quality method for industrial processing of the fruit.

Keywords:
infrared radiation; yellow peach; peeling; response surface methodology; optimization analysis

Levels	X₁	X₂	X₃
Levels	Radiation distance (mm)	Heating time(s)	Infrared Power(W)
-1	60	120	800
0	80	240	900
1	100	360	1000

Order	Factor			Response
	X₁	X₂	X₃	Y₁	Y₂	Y₃
	Radiation distance (mm)	Heating time(s)	Infrared Power(W)	Surface temperature(°C)	Firmness loss(×10⁵Pa)	Full peeling time (s)
1	60(-1)	120(-1)	900(0)	196	2.6	314
2	100(1)	240(0)	1000(1)	180	3.2	264
3	100	360(1)	900	205	4.3	256
4	60	240	800(-1)	162	3.6	258
5	80(0)	240	900	198	3.2	195
6	80	240	900	200	3.4	201
7	60	360	900	213	4.5	204
8	100	240	800	156	3.2	310
9	60	240	1000	215	4.2	218
10	80	120	800	163	2.5	270
11	80	240	900	195	3.5	198
12	80	360	800	187	4	125
13	80	360	1000	230	4.6	120
14	100	120	900	163	2	365
15	80	240	900	190	3.2	206
16	80	120	1000	195	2.3	192
17	80	240	900	202	3.25	198

Parameter	Response variable
Parameter	Surface temperature	Firmness loss	Full peeling time
Model	<0.0001^* * Terms are significant (p < 0.05); ns means that terms are not significant (p > 0.05).	<0.0001*	<0.0001*
Lack of fit	0.9989 ns	0.3907 ns	0.9609 ns
Std. Dev.	3.56	0.14	3.25
R²	0.9871	0.9847	0.9889
Adj R²	0.9705	0.9651	0.9872
c.v.%	1.86	4.21	1.42
Adeq Precisior	27.135	24.717	98.181

Item	Surface temperature		Firmness loss		Full peeling time
Item	Coefficient	Significant	Coefficient	Significant	Coefficient	Significant
Constant	197		3.31		199.6
X1	-10.25	<0.0001^* * Terms are significant (p < 0.05).	-0.27	<0.0009*	25.13	<0.0001*
X2	14.75	<0.0001*	1	<0.0001*	-54.5	<0.0001*
X3	19	<0.0001*	0.12	0.0421*	-21.13	<0.0001*
X₁X₂	6.25	0.0098*	0.1	0.203	0.25	0.8821
X₁X₃	-7.25	0.0047*	-0.15	0.0732	1.5	0.3867
X₂X₃	2.75	0.1658	0.2	0.0232*	18.25	<0.0001*
X₁²	-9.13	0.0012*	0.12	0.1275	84.45	<0.0001*
X₂²	6.37	0.0079*	0.08	0.2869	-0.3	0.8552
X₃²	-9.62	0.0009*	0.12	0.1275	22.55	<0.0001*

Factor			Response
Factor			Optimization results			Test results
Radiation distance (mm)	Heating time(s)	Infrared Power(W)	Surface temperature (°C)	firmness loss(×10⁵pa)	Full peeling time(s)	Surface temperature(°C)	firmness loss(×10⁵pa)	Full peeling time(s)
76	256	1000	211.7	3.8	149.6	217	3.7	153

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[1] *Corresponding author: songwd@163.com