menu menu_open
Brasil
home Sumário navigate_before Anterior Atual Seguinte navigate_next
home Sumário
Plant Genetics • Genet. Mol. Biol. 30 (3) • 2007 • https://doi.org/10.1590/S1415-47572007000400022 linkcopy

Open-access Quantitative trait loci mapping of pubescence density and flowering time of insect-resistant soybean (Glycine max L. Merr.)

AuthorshipSCIMAGO INSTITUTIONS RANKINGS

    Analysis of antibiosis resistance to common cutworm (Spodoptera litura Fabricius) in soybean (Glycine max (L.) Merr.) has progressed significantly, but the immediate cause remains unknown. We performed quantitative trait loci (QTL) analysis of pubescence density and plant development stage because these factors are assumed to be the immediate cause of resistance to cutworm. The QTLs for pubescence appeared to be identical to the previously detected the Pd1 and Ps loci controlling pubescence density. We found no candidate loci for flowering time QTLs, although one could be identical to the gene governing the long-juvenile trait or to the E6 loci controlling maturity. None of the QTLs overlapped with the QTLs for antibiosis resistance.

    Glycine max; hair; maturity; pest resistance; QTL; SSR

    vertical_align_top file_download show_chart
    location_on
    Sociedade Brasileira de Genética Rua Cap. Adelmio Norberto da Silva, 736, 14025-670 Ribeirão Preto SP Brazil, Tel.: (55 16) 3911-4130 / Fax.: (55 16) 3621-3552 - Ribeirão Preto - SP - Brazil
    E-mail: editor@gmb.org.br
    rss_feed Acompanhe os números deste periódico no seu leitor de RSS
    Acessibilidade / Reportar erro