Comparative Analysis of the Aeronautical Certification Process Against Nonionizing Radiation and the Management Proposal for Ionizing Radiation

Ferreira, Marcelo Tadeu Motta; Federico, Claudio Antonio

doi:10.1590/jatm.v14.1251

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ORIGINAL PAPER • J. Aerosp. Technol. Manag. 14 • 2022 • https://doi.org/10.1590/jatm.v14.1251 copy

Comparative Analysis of the Aeronautical Certification Process Against Nonionizing Radiation and the Management Proposal for Ionizing Radiation

Authorship SCIMAGO INSTITUTIONS RANKINGS

ABSTRACT

Today, the certification process for onboard electro-electronic systems against nonionizing radiation can be considered mature and independent, having its own set of requirements. In turn, the current proposal for this process with regard to ionizing radiation is relatively recent and is in the process of improvement and discussion by industry and regulatory bodies, and presents important differences in approach. In this work these two processes are presented comparatively in detail, pointing out similarities and differences in order to contribute to this ongoing discussion, which should, in the medium term, result in regulation for the effects of ionizing radiation.

Keywords
Ionizing radiation; Single event upsets; Certification; Aeronautics; Management

HIRF REQUIREMENTS EXCERPTS FROM §§ 23.1308, 25.1317, 27.1317, AND 29.1317	FAILURE CONDITION	SYSTEM HIRF/L CERTIFICATION LEVEL^ Systems classified as levels D and E are exempt from demonstrating compliance with the requirements. Source: Adapted from FAA (2014).
Each electrical and electronic system that performs a function whose failure would prevent the continued safe flight and landing of the rotorcraft/airplane.	Catastrophic	A
Each electrical and electronic system that performs a function whose failure would significantly reduce the capability of the rotorcraft/airplane or the ability of the flight crew to respond to an adverse operating condition.	Hazardous	B
Each electrical and electronic system that performs a function whose failure would reduce the capability of the rotorcraft/airplane or the ability of the flight crew. to respond to an adverse operating condition^* * For lightning, this text is applicable for levels B and C.	Major	C

HIRF/L Test		SEE Test (high-altitude)		SEE Test (standard altitude)
Laboratory cost for radiated and conducted HIRF: 4 days × 8h/day	4d × US$ 1,500/d = US$ 6,000	Neutrons trial: 4 DUTs × 3 samples each × 2 h beam = 24 h	24 h × US$ 600/h = US$ 14,400	Neutrons trial: 4 DUTs × 3 samples each × 2 h beam = 24 h	24 h × US$ 600/h = US$ 14,400
Laboratory cost for Lightning: 2 days × 8h/day	2d × US$ 1,500/d = US$ 3,000	Heavy ions trial: 4 DUTs × 3 samples each × 4 h beam = 48 h	48 h × US$ 1,200/h = US$ 57,600	NA	NA
Total	US$ 9,000	Total	US$ 72,000	Total	US$ 14,400

SEE process step	Observation	Recommendation
1	There is a lack of guidance on how to conduct the rigor of the certification process.	Consider section 6 of IEC (2013).
2	Greater complexity for SEE than for HIRF/L.	-
3	Failure propagation analysis is extremely complex.	Conduct ionizing radiation tests at the equipment level and check for performance.
4	SEE <-> reliability/probabilistic HIRF/L <-> performance/deterministic	Conduct ionizing radiation tests at the equipment level and check for performance.
5	SEE tests are more complex and expensive than HIRF/L. Databases are scarce and do not provide necessary information.	Construction of databases of SEE rates or component cross-section curves. Issue standard guidance for SEE testing.
6	-	-
7	-	Need to issue an SEE Certification Plan.
8	The SEE impact analysis is not input to PSSA but takes place in parallel with the evolution process from PSSA to SSA.	It is needed that Certification Authorities clearly address the link between SEE and SSA in a guidance document.

Departamento de Ciência e Tecnologia Aeroespacial Instituto de Aeronáutica e Espaço. Praça Marechal do Ar Eduardo Gomes, 50. Vila das Acácias, CEP: 12 228-901, tel (55) 12 99162 5609 - São José dos Campos - SP - Brazil
E-mail: submission.jatm@gmail.com

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[1] *Correspondence author: mtferrei@terra.com.br