Ionic fragmentation of methylmethacrylate has been observed using synchrotron radiation and laser excitation. A recently developed time-of-flight mass spectrometer was used for the ionic identification. In the case of synchrotron radiation, both low energy (12.1 eV) and high energy (287.9 eV) photons were used. Although a definite increase in fragmentation was observed while moving from 12.1 to 287.9 eV, the fragmentation pattern remained basically the same in both cases. The parent peak stays clearly visible and intense fragments, associated with m/q = 15, 39, 41 and 69 dominate both synchrotron radiation-induced spectra. Multiphoton ionization causes much extensive fragmentation, the parent ion could not be observed, and C+ ion becomes the most intense peak in the spectrum. Ions at m/q = 15, 39, 41 and 69 are observed using laser and synchrotron radiation, which demonstrates their high stability. Doubly or multiply-charged ions have not been observed.
methylmethacrylate; synchrotron; multiphoton ionization
