Dielectric Anomaly Origin Study for Ferroelectric Ceramic of Type PZT52/48 Erbium-doped at High-temperatures

In present work, erbium-doped PZT 52/48 ceramics at sites A and B were prepared by the Pechini method in order to study their dielectric properties. The aim was investigated the dielectric anomalies of interfacial origin in these ferroelectrics. The ceramics were also submitted to electrical measurement analysis. The dielectric response of the grains showed characteristics of materials that follow Curie-Weiss law which is typical of ferroelectrics. In high temperatures and low frequencies, it was detected the dielectric anomaly phenomenon for the ceramic samples. Impedance spectroscopy analyzes through equivalent circuit (brick-layer model), grain and grain boundary in series, exposed a predominance of dielectric properties of intergranular interfaces as the cause of this anomaly. The electrical characterization showed a peculiar ferroelectric-paraelectric phase transition around 390 °C for both samples.

Keywords:
PZT-based; Impedance spectroscopy; Dielectric properties; Dielectric anomalies