Quantitative Metallographic Parameters to Describe Microstructures of Multiphase Materials

Abstract

One typically characterizes the transformation kinetics of a parent phase, α, into a single phase, β, by measuring the volume fraction transformed, $V_V^{\beta }$, against time. Sometimes one also reports the interfacial area density between the new and the parent phase, $S_V^{\alpha \beta }$, against the volume fraction transformed. $S_V^{\alpha \beta }$ is a dynamic interface. It migrates as the growth of the new phase takes place. Interfaces between transformed phases might be called static interfaces. These may be present before transformation starts, for example, grain boundaries of a polycrystalline parent phase. Alternatively, static interfaces, $S_V^{\beta \beta },$may appear during the transformation because of impingement. Therefore, one may better understand the microstructural evolution following the behavior of the volume fraction, dynamic and static interfaces. A more complicated situation occurs if the parent phase transforms into two or more product phases, for example, α→β,γ. In this work, we apply parameters to describe the transformation of a parent phase into a single phase, the contiguity and the dispersion, to the situation in which the parent phase transforms into two or more phases. We tested these parameters against computer simulations and concluded that they combine a good description of the behavior of the simulated transformations and simplicity.

Keywords:
phase transformations; recrystallization; simultaneous and sequential transformations; computer simulation; microstructures; quantitative parameters